Combining more than 30 years of experience as well as innovative and efficient solutions, Cohu provides contactors for all the applications and challenges offered by our customers.
In addition to the local support provided by Peritest, Cohu’s specialist engineers, located near the main manufacturing sites in Europe, Asia and the USA, can provide support for the success of your project.
All brands and models of handlers
All types of handlers, gravity, pick & place, turret, and “strip”.
Leaded and leadless device packages.
Fine pitch down to 0.25mm
Currents up to 1000A
High voltages up to 5kV
Specific contactors for sensor testing
Frequency test up to 100 GHz
“Tri-temperature” test capability with high precision at elevated temperatures.
High-tech body and materials
Optimised design and geometry for high production volumes
The most cost effective solution
Various interface options
Low cost and easy to replace contact springs
Functional test at wafer level. Vertical technology probe cards
The “Wafer level test” is a final test performed at wafer level. The electrical characteristics are generally the same as those of final test. The handling of the wafers is carried out by a prober.
Contact at “Wafer Level” is made on the device’s “bumps”, as in final test. The devices to be tested may therefore not have a flat level surface, unlike packaged devices. The contactor must be able to adapt to this situation. Wafer level test is required for cost sensitive applications. The test socket must also be good value for money and provide low CoT (Cost of Test).
The same test head equipped with a guide and a “Manual Actuator” can be used for testing sawn WLCSP (Wafer Level Chip Scale Packages) devices. Cohu QuadTech ™ Test Contactors offers a variety of technologies for wafer-level testing.
The same test head equipped with a guide and a “Manual Actuator” can be used for testing sawn WLCSP components. Cohu QuadTech ™ Test Contactors offers a variety of technologies for wafer-level testing.
